Abstract:Scan based built-in self-test (BIST), which naturally extends scan-based test methodology with test patterns applied from test equipment to BIST, can be used for the self test of sequential circuits and attain higher fault coverage. If the circuit under test (CUT) contains multiple parallel scan chains, a parallel generator is needed. Known as the common pseudo-random pattern generator (PRPG), an LFSR can be configured to generate a random pattern stream. The PRPG-based patterns may be applied to the existing scan architecture directly from the LFSR, or through some decorrelation logic. In order to attain higher fault coverage, it is very important to analyze the test pattern generation in the scan based BIST. The paper presents a kind of scheme for test pattern generation in the scan based BIST for the circuits with multiple scan chains. In the test pattern generation scheme the PRPG, which is implemented by an LFSR, shifts the sequences into all scan chains simultaneously. The correlativity weight R(M) of multiple scan chains is also defined in the paper. Based on the analysis of the different degree effect on fault coverage due to the different configuration of multiple scan chains, one conclusion is drawn that the probability that the fault coverage is reduced is increased with an increase of the correlativity weight R(M). If the circuit is tested by the multiple scan chains with the minimum R(M), the probability that the fault coverage is reduced is least. In the paper a method to construct multiple scan chains with minimum correlativity weight R(M) is proposed to overcome the bad effect on fault coverage due to the correlation between scan chains. Furthermore the minimum set of deterministic patterns is generated for hard-to-test faults by ATPG and the set is used to design the bit modifying logic circuit (BML), which is located between multiple scan chains and the CUT. Through BML the signals in multiple scan chains are controlled to input to the CUT. When the test control signal is low, the test patterns in multiple scan chains are input into the CUT directly. When the test control signal is high, the value of the signals at certain bit positions in the multiple scan chains are modified by BML and the changed test patterns are input into the CUT to test hard-to-test faults for complete fault coverage. The experiments on some ISCAS'89 benchmark circuits show that the complete fault coverage can be obtained by the test method presented by the paper. The overhead of BML is also analyzed.

Test Pattern Generation in Built-In Self-Test with Multiple Scan Chains

Low Cost Test Pattern Generation in Scan-Based BIST Schemes

A Low Power Test Pattern Generation Method

A Low Power Test Pattern Generation for Built-in Self-Test Based Circuits

A Low Power Test Pattern Generator for Bist

Scan BIST with Biased Scan Test Signals

A Low Cost Test Pattern Generator for Test-Per-clock BIST Scheme.

Test Patterns of Multiple Sic Vectors: Theory and Application in Bist Schemes

A Generation Method for Test Patterns with Low Power and Low Cost

Test Pattern Generation Based On Multi-Trc Scan Architecture For Reducing Test Cost

Improving test effectiveness of scan-based BIST by scan chain partitioning

Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding

Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST

A Unified Solution to Reduce Test Power and Test Volume for Test-per-scan Schemes

Test pattern generation for static burn-in based on equivalent fault model

Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning

Low-power Weighted Random Pattern Testing

Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan Arhcitecture

Test Pattern Generation Based on Variable-Cycle Reseeding LFSR Structure

CA optimization based on simulation annealing in BIST

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering