Preparation and Characterization of (110) Diamond Films Used for Field-Effect Transistors

Fengjuan Zhang,Qingkai Zeng,Xiaoyu Pan,Mei Bi,Xingmao Yan,Jian Huang,Ke Tang,Jijun Zhang,Linjun Wang
DOI: https://doi.org/10.1117/12.888210
2010-01-01
Abstract:In this work, H-terminated (110) diamond film, a novel active material for high-frequency and high-power field-effect transistors (FETs), was successfully prepared by hot filament chemical vapor deposition (HFCVD) method using acetone as carbon source. X-ray diffraction (XRD) measurements showed that at a lower pressure of 2 KPa and a C/H ratio of 40/200, a higher intensity of (110) diffraction peak with a narrower full width at half maximum (FWHM) was detected which meant highly (110) preferential orientation of diamond films. H-terminated films were achieved by the hydrogen gas pressure of 5KPa and a microwave power of 2.4KW. The H-terminated (110) diamond films obtained were suitable for FETs. Hall Effect measurement indicated that the sheet carrier density of (110)-oriented films was 2.2x10(13)cm(-2), and 2.3 times higher than that of the randomly-oriented films.
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