Improved Working Properties of RF MEMS Switch by Pre-Injecting Charges into the Dielectric Layer

Shizhu Wen
2010-01-01
Abstract:Simulations were used to analyze the driving and working properties of radio frequency micro-electro-mechanical system (RF MEMS) switch. The results show that the capacity-voltage curve is shifted by the accumulation of trapped charges within the dielectric layer, which will lead to a failure of the RF switch. Failure can be presented by pre-injected charges into the dielectric layer with a revised voltage driving mode. Simulations and tests show that the driving voltage can be optimized to half of its original amplitude without varying the original structure and design of the RF switch. Simulations agree well with experiments to validate the method's feasibility. The pre-injected charges prevent further trapped charges, therefore prolonging the switch lifetime.
What problem does this paper attempt to address?