Preparation of Siox Nanowires in Different Atmosphere, Their Morphology, Pl and Ftir Properties

Zheng Li-Ren,Huang Bai-Biao,Wei Ji-Yong
DOI: https://doi.org/10.7498/aps.58.2306
IF: 0.906
2009-01-01
Acta Physica Sinica
Abstract:Highdensity SiOx nanowires were fabricated on a largescale using carbonassisted CVD method by Fe—Al—O catalyst at 1140℃ in flowing N2/H2,N2 and NH3 atmospheres.The SiOx nanowires have uniform diameters of 20—300 nm and lengths of up to a few hundred micrometers. SEM, TEM, EDS, FTIR and PL were preformed to characterize the microstructure, composition and optical performance of the nanowires. Energy dispersive Xray spectral analysis reveals that the nanowires consist of Si and O elements in an atomic ratio of approximately 1∶18The nanowires show IR absorption peaks at 482,806,1095 and 1132 cm-1. The PL peak of the nanowires is located at 440 nm (283eV).The PL inensity of the SiOx nanowire (N2) is 104 times that of the SiOx nanowire(N2/NH3).
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