An experimental extracted model for latchup analysis in CMOS process

Ye Li,Xiaohan Gong,Weiwei Xu,Zhiliang Hong,Dirk Killat
DOI: https://doi.org/10.1109/ASICON.2009.5351514
2009-01-01
Abstract:The latchup phenomenon is analyzed theoretically. A practical analytical model derived from Ebers-Moll formulations is proposed to analyze, simulate, and predict latchup, with favorable legitimacy and flexibility. The model parameters are extracted on 0.25 um CMOS process from experiments. The extracted model can predict latchup successfully in circuit level when applied in SPICE.
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