Analysis of Gate-Delay Models for High-Speed CMOS Circuits

李伟良,史峥,杨华中,王书江,严晓浪
DOI: https://doi.org/10.3969/j.issn.1007-0249.2003.06.004
2003-01-01
Abstract:With the narrower IC characteristic size, interconnect resistance plays a greater role in timing. New effective delay models that care about wire resistance are very much needed. After analyzing the traditional timing models, a modified ECSM (Effective Current Source Model), which captures the non-linearity of quasi-capacitive loading by two piecewise-linear approximations, is proposed. Modeling quality is evaluated both by theoretic and experimental approaches, the results show that the improved model possesses advantages in terms of accuracy, speed and adaptability to advanced IC technology.
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