Understanding and modeling of internal transient latch-up susceptibility in CMOS inverters due to microwave pulses.

Jie Chen,Zhengwei Du
DOI: https://doi.org/10.1016/j.microrel.2013.07.004
IF: 1.6
2013-01-01
Microelectronics Reliability
Abstract:•Internal transient latch-up mechanism due to microwave pulses was investigated.•Pulse width and pulse repetition frequency effects on latch-up were investigated.•A physics-based model to capture pulse width effects was proposed.•A physics-based model to capture pulse repetition frequency effects was proposed.
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