Molecular Beam Epitaxy and Micro-Structural Characterizations for PbSe Single Crystal Films

XU Tianning,WU Huizhen,SI Jianxiao,CAO Chunfang,HUANG Zhanchao
DOI: https://doi.org/10.3321/j.issn:1005-3093.2006.06.013
2006-01-01
Abstract:PbSe single-crystal films were grown on (111) surface of BaF_2 substrate by molecular beam epitaxy and the surface morphology micro-structural were obcerved.The results show that a 2D layer-by-layer mode prevails during PbSe film growth at high Se/PbSe beam flux ratios (≥0.4).Strain in the PbSe epilayers relaxes completely by the glide of dislocations,which leads to plastic deformation of epilayer,and the main features of surface morphologies are atomic smooth surface steps and spirals. Regular triangle holes were observed for the first time on the surface of PbSe epilayers which were grown at low Se/PbSe beam flux ratio (0.2).When Se/PbSe beam flux ratio was further decreased to 0,3D islands formed on the PbSe surface,and the strain only relaxed partially.The optimal growth temperature for PbSe film is 450℃.
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