Microstructure and Optical Properties of Pb_(1-x)Sr_xSe Thin Films

Wang Qing-Lei,Wu Hui-Zhen,Si Jian-Xiao,Xu Tian-Ning,Xia Ming-Long,Xie Zheng-Sheng,Lao Yan-Feng
DOI: https://doi.org/10.3321/j.issn:1000-324x.2007.06.018
IF: 1.292
2007-01-01
Journal of Inorganic Materials
Abstract:High quality Pb1-xSrxSe (0 <= x <= 0.050) thin films were grown on BaF2(111) substrates by using molecular beam epitaxy(MBE). Optical and structural properties of the Pb1-xSrxSe films were studied using transmission spectrum and high resolution X-ray diffraction (HRXRD). HRXRD patterns indicate that Pb1-xSrxSe films has cubic-phase structure, with no SrSe phase separation. The films orientation is parallel to (111) surface of substrate. The lattice constants of the Pb1-xSrxSe films increase with increasing Sr content. The Sr content can be obtained by using Vegard formula. Sharp absorption edges are observed in the transmission spectrum of Pb1-xSrSe films. The fundamental band gap of the Pb1-xSrxSe films is attained by simulation. Refractive indexes and absorption coefficients near the fundamental band-gap are obtained by simulation using dielectric function model(DFM).
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