Microstructure and Optical Properties of Pb1-xGexTe Films

JC Jiang,B Li,L Zhang,ZQ Zhang,SY Zhang,HS Cheng,FJ Yang
DOI: https://doi.org/10.1143/jjap.41.4594
IF: 1.5
2002-01-01
Japanese Journal of Applied Physics
Abstract:Pb1-xGexTe thin films and Pb1-xGexTe/ZnSe (1)(x = 0.08) multilayer coatings were prepared on Si substrates and Ge substrates with a thermal evaporation technique: Crystallographic analysis showed that the films are polycrystalline, and transmission electron microscope (TEM) observation revealed that the Pb1-xGexTe/ZnSe multilayer coating has a dense and homogeneous structure. The refractive indices of the thin films were measured in the spectral range of 6.5-25 mum, over the temperature range of 85-300 K. The temperature coefficient, dn/dT, was found to be dependent on the wavelength and substrate temperature. For the film deposited on Ge substrates at 180degreesC, the value of dn/dT at 10 mum is 0K(-1) over the temperature range of 85-300 K. A 10.8 mum band-pass filter made of Pb1-xGexTe/ZnSe was fabricated, and a very slight spectral shift of the band-pass edge was found to occur with decreasing temperature.
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