Optimization of the Electron Blocking Layer in GaN Laser Diodes

Li Ti,Pan Huapu,Xu Ke,Hu Xiaodong
DOI: https://doi.org/10.3969/j.issn.1674-4926.2006.08.024
2006-01-01
Chinese Journal of Semiconductors
Abstract:In view of the transport mechanism of electrical carriers,the factors involved in the current overflow in GaN-based laser diodes are analyzed,and the aluminum mole fraction as well as the p-doping concentration of the AlGaN electron blocking layer are optimized.The results indicate that the appropriate barrier height (the Al mole fraction) is lower when the p-doping concentration is higher.
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