A design and comparative investigation of graded AlxGa1 − x N QB for W-Al0.58GaN/W-Al0.64–0.58 GaN DUV laser diode on AlN substrate
Hameed Ur Rehman,Naveed Ur Rahman,Inayatul Haq,Fang Wang,Yuhuai Liu
DOI: https://doi.org/10.1140/epjd/s10053-024-00811-z
2024-02-14
The European Physical Journal D
Abstract:In this study, we aim to improve the efficiency of AlGaN-based deep-UV-LD by thickness grading and composition grading of the quantum barrier. We proposed the structure of DUV-LD, and then we conducted the simulation via LASTIP software to check the opto-electronics properties of the proposed structure. In the results, we observed that by decreasing the thickness grading and composition grading of the AlGaN-based deep-UV laser, the output power increased to 98 mW, the conduction band barrier height increased to 570 meV, the intensity of device, hole-current density, and the stimulated recombination rate also increased. However, by decreasing the thickness and composition grading of the AlGaN-semiconductor-based deep-UV-LD, valence band barrier height 132 meV, threshold voltage 4.43 V, threshold current 25.27 mA, and electron current density also decreased. It shows that if the composition grading of AlGaN-based DUV-LD decreases, then the performance of the device increases.
optics,physics, atomic, molecular & chemical