Capacitance extraction of on-chip circular stacked inductors

XiaoCha Liu,Liang Lin,Wenyan Yin,Junfa Mao
DOI: https://doi.org/10.1109/APMC.2005.1606439
2005-01-01
Abstract:In this paper, we proposed a method to characterize the capacitive coupling effects in circular stacked inductors, which takes the non-overlapping between upper and bottom traces of different layers into account. Compared with the full-wave method and the analytical method with completely overlapping assumption, our method can predict self-resonant frequency (fSR) for on-chip circular stacked inductors used in RFICs more accurately.
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