Growth of High Mobility Transparent Conducting In2O3:Mo Thin Film

Xifeng LI,Weina Miao,Qun Zhang,Li Huang,Zhuangjian Zhang,Zhongyi Hua
DOI: https://doi.org/10.3969/j.issn.1672-7126.2005.02.015
2005-01-01
Abstract:High mobility molybdenum-doped In2O3 films (IMO) have been grown on the normal glass substrate by DC magnetron sputtering. The effects of oxygen partial pressure, substrate temperature and sputtering current on the optoelectric properties of IMO films were studied. The films with minimum resistivity of 3.65 × 10-4 Ω·cm were obtained. The highest carrier mobility is more than 50 cm2 V-1 s-1, while the average visible transmittance, including 1.2-mm-thick glass substrate between 400 nm and 700 nm, is greater than 80%. We found that the films are sensitive to the oxygen concentration in the sputtering environment. X-ray diffraction (XRD) measurements indicate that the films show good crystallinity. The analysis reveals that the high carrier mobility is mainly limited by grain scattering.
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