Growth and Annealing of High Mobility Transparent Conductive Tungsten-Doped Indium Oxide Films

Li Guifeng,Zhang Qun,Li Xifeng
DOI: https://doi.org/10.13922/j.cnki.cjovst.2008.02.010
2008-01-01
Abstract:Transparent conductive,tungsten-doped indium oxide(IWO) films with the high carrier molbility were grown by magnetron sputtering on glass substrates,followed by in-situ annealing.The microstructures,optical and electrical properties of the IWO films were characterized with X-ray diffraction(XRD),atomic force microscopy(AFM),ultraviolet visible light(UV-Vis) spectro photometry and van der Pauw method.The influence of oxygen partial pressure and annealing on the electro-optical properties was investigated.It is found that the electro-optical properties of the films are sensitive to the oxygen partial pressure,and can be improved by the annealing treatment.The high quality IWO films,with the lowest resistivity of 2.2×10-4 Ω·cm,a carrier mobility of 63.5 cm2/V·s and an average transmission higher than 83.2% in the visible light range,were obtained.
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