Kelvin Probe Force Microscopy Study on Anodization-Related Variations of Porous Silicon Nanostructures Combined with Photoluminescence and Raman Scattering

P He,JH Li
2005-01-01
Abstract:Microscopic structure of as-anodized porous silicon obtained at different current densities and anodization time has been studied using photoluminescence, Kelvin probe force microscopy and Raman scattering. The shallow hillocks form a cluster-like surface under small current density as well as anodization time. As the current density and anodization time increase, the surface layer of the porous silicon and the corresponding surface potential become rougher and larger, respectively. Also, the stronger reproducible photoluminescence and the downshift as well as asymmetric broadening of the Raman lines are observed. A blue-shift of the photoluminescence band of as-anodized porous silicon is observed with increasing the current density while a red-shift is observed with increasing the anodization time in the electrochemical etching process.
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