Fabrication and investigation of AlGaN-based Schottky barrier diode

邵庆辉,叶志镇,黄靖云,赵炳辉,江红星,林景瑜
DOI: https://doi.org/10.3785/j.issn.1008-973X.2004.10.002
2004-01-01
Abstract:The AlGaN-based Schottky barrier diode was fabricated using electron beam deposited Au and Ti/Al as the Schottky contact and ohmic contact respectively for high power and high temperature applications such as microwave mixers and rectifiers. And the AlGaN/GaN/sapphire was grown by metal organic chemical vapor deposition (MOCVD). Measurements of the I-V characteristics of the diode show that the device has good rectifying property, high breakdown voltage of 95 V and ideal factor with value of 1.93. The forward and reverse current characteristics were improved greatly after annealing at 300°C for 1 min. The barrier height of the Au/AlGaN Schottky contact was as high as 1.08 eV by analysis of various I-V curves under corresponding temperatures. The results show that the device can be used in high power and large current rectification.
What problem does this paper attempt to address?