1.43 kV GaN-based MIS Schottky barrier diodes

Fuping Huang,Chunshuang Chu,Zhizhong Wang,Kangkai Tian,Hehe Gong,Yonghui Zhang,Yongjian Li,Jiandong Ye,Zi-Hui Zhang
DOI: https://doi.org/10.1088/1361-6463/ad256c
2024-02-03
Journal of Physics D Applied Physics
Abstract:In this letter, we report on a quasi-vertical GaN-based metal-insulator-semiconductor (MIS) Schottky barrier diode with an insertion of 2 nm thick Al 2 O 3 dielectric layer. It shows a turn-on voltage of 0.7 V, a specific on-resistance of 3.5 mΩ·cm 2 , and a high on/off current ratio of 10 11 . The proposed structure enables a breakdown voltage of 1430 V, rendering a Baliga's power figure-of-merit of 0.58 GW·cm -2 . The enhanced performance is attributed to defect-related leakage can be suppressed and the direct tunneling process dominates at the MIS-based Schottky contact interface.
physics, applied
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