Impact of gate overlap on electron transport in UTB nMOSFET

Zhiliang Xia,Gang Du,Xiaoyan Liu,Ruqi Han
2004-01-01
Abstract:This paper presents a study of the impact of gate overlap in source/drain region on electron transport in 20nm UTB nMOSFET by using 2D Full-Band Single-Particle Monte Carlo method. The electron velocities in source-side region and drain-side region with various gate overlap are studied in detail, and the characteristic of on-current is also studied.
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