STUDY ON STRUCTURE PROPERTIES OF CuInSe2 THIN FILMS BY ALLOYS PRECURSORS POST-SELENIZATION

张加友,龚晓波,刘维一,薛玉明,李凤岩,周志强,孙云,李长健,孙钟林
DOI: https://doi.org/10.3321/j.issn:0254-0096.2003.03.012
2003-01-01
Abstract:The CIS thin films were fabricated by alloy precursors post-selenization. The experimental investigation on the structures and characterizations of CIS thin films were carried out. The XRD analysis reveals that the post-selenization temperature is very important for forming a CIS thin film and also the thin films are CIS mainly in a proper selenizing conditions when the range of Cu/In is from 0.98 to 2.34. Raman spectrum analysis reveals that there are 210 cm-1 peak and 229 cm-1 peak except the 174 cm-1 peak. The 260 cm-1 peak shows the character of a Copper-rich thin film. The peak position and intensity depend on the ratio of Cu/In. These variations of characteristic peak maybe correspond to heterophase materials. The optical and electrical character measurements show that the band gap is l.05 eV while Cu/In=0.98. The activity energy is 0.486 eV.
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