Doping Characteristics of Mg in InGaAlP and GaP

纪刚,李越生,曹永明,华铭
DOI: https://doi.org/10.3969/j.issn.1674-4926.2001.06.011
2001-01-01
Abstract:In InGaAlP and GaP, the doping characteristics of Mg in MOCVD were studied by using SIMS (secondary ion mass spectrometry) measurement. The experimental results show that the Mg incorporation is limited by the Mg revaporization from the growth surface at a higher temperature, and the Mg activity decreases with the increase of Cp2Mg flow-rate because the Mg concentration is increased while the carrier concentration keeps constant. The values of revaporization activation energy of Mg in InGaAlP and GaP are 0.9 eV and 1.1 eV respectively.
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