Characterization and optical propagation loss of sol-gel derived TiO2/SiO2 films

Zhai Jiwei,Yao Xi,Zhang Liangying
DOI: https://doi.org/10.1088/0022-3727/33/23/301
2000-01-01
Abstract:Thin films of TiO2-SiO2 were prepared by a sol-gel process. The refractive indices and extinction coefficients of these films as a function of wavelength were calculated using optical transmission spectra. The relationships of the fabricating technology, refractive indices and extinction coefficients were studied. With increasing TiO2 content and heat treatment temperature, the refractive index of the films increased. The relationships between the surface roughness, coating layer number, optical propagation loss and preparation technology were studied.
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