Abstract:It is shown that the size effect recently observed by Espinosa et al., [J. Mech. Phys. Solids51, 47 (2003)] in pure tension tests on free thin metallic films can be explained by the existence of a boundary layer of fixed thickness, located at the surface of the film that was attached onto the substrate during deposition. The boundary layer is influenced by the epitaxial effects of crystal growth on the dislocation density and texture (manifested by prevalent crystal plane orientations). This influence is assumed to cause significantly elevated yield strength. Furthermore, the observed gradual postpeak softening, along with its size independence, which is observed in short film strips subjected to pure tension, is explained by slip localization, originating at notch-like defects, and by damage, which can propagate in a stable manner when the film strip under pure tension is sufficiently thin and short. For general applications, the present epitaxially influenced boundary layer model may be combined with the classical strain-gradient plasticity proposed by Gao et al., [J. Mech. Phys. Solids 47, 1239 (1999)], and it is shown that this combination is necessary to fit the test data on both pure tension and bending of thin films by one and the same theory. To deal with films having different crystal grain sizes, the Hall–Petch relation for the yield strength dependence on the grain size needs to be incorporated into the combined theory. For very thin films, in which a flattened grain fills the whole film thickness, the Hall–Petch relation needs a cutoff, and the asymptotic increase of yield strength with diminishing film thickness is then described by the extension of Nix’s model of misfit dislocations by Zhang and Zhou [J. Adv. Mater. 38, 51 (2002)]. The final result is a proposal of a general theory for strength, size effect, hardening, and softening of thin metallic films.

SMALL ANGLE X-RAY DIFFRACTION OF THE SINGLE METAL FILM

SMALL-ANGLE X-RAY DIFFRACTION STUDY OF AMORPHOUS MULTILAYER AND SINGLE LAYER THIN FILMS

Study on the property of subwavelength imaging in a metal thin-film structure

Study of Small Angle X-ray-diffraction Theory of Multilayer for Water Window Reign X-ray

X-ray-diffraction theory of multilayer with no sharp interface

X-ray scattering methods for films and multilayers and their applications

Epitaxially Influenced Boundary Layer Model for Size Effect in Thin Metallic Films

NONDESTRUCTIVE MEASUREMENT OF THE THICKNESS OF FILM MATERIAL BY X-RAY ANALYZER

A Method of the X-ray Diffraction of Substrate for Measuring Films Thickness

Determination of the Structure of Weakly Ordered Films According to X-ray Diffraction Data

Buckling Behavior Of Metal Film/Substrate Structure Under Pure Bending

Analysis of Surface and Interface Modifications of Thin Multilayered Films

Analysis Of The Thickness Measurement Of Multilayer Optical Thin Films With Grazing Incident X-Ray

X-Ray Scattering Technologies of Microstructure Analysis of Thin Films

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

Single-Scan Method For Determination Of The Thickness And Optical Constant Of Thin Metal Film

X-Ray Residual Stress Measurement in Films with Crystallographic Texture and Grain Shape

Direct structure depth profiling of polycrystalline thin films by X-ray diffraction and its application

Confirmatory experiment for calculation of penetration depth of X-ray in polyethylene thin film

Linear Opening Model of Substrate Pre-crack and Determination of Fracture Strain of Thin Film during Tensile Testing of Microbridge Method

An Alternative Micro-Area X-Ray Diffraction Method for Residual Stress Measurement of Pb(Zr,Ti)O-3 Film