Abstract:A reformulation of the Thomson-Haskell method is presented for calculating the reflection coefficients of multilayer structure immersing in the coupling fluid. Instead of directly multiplying the layer propagator matrix, the new method splits the layer propagator matrix and excursively determines the interface stiffness matrix starting from the bottom half-space with known stiffness. A formulation for the reflection coefficients is derived based on the obtained interface stiffness matrix of the top layer. This scheme can be applied to a single solid layers or layered structures containing both fluid and solid layers. It keeps the simplicity but naturally excludes the exponential growth term and thus can be applied at any frequency range. Its validity and feasibility were experimentally proved by the measurement of the reflection coefficients of a three layered structure of aluminum-glass-aluminum and a sandwiched layer structure of two 250 mu m stainless plates filled with 100 mu m deionized water based on the inversion of V(z, t) technique. The result of experiments is consistent with the theoretical calculation. The reformulation of the Thomson-Haskell method offers an efficient and effective solution for calculating the acoustic reflection coefficients of multilayer structures of any configurations. (C) 2012 Elsevier B.V. All rights reserved.

X-ray-diffraction theory of multilayer with no sharp interface

Study of Small Angle X-ray-diffraction Theory of Multilayer for Water Window Reign X-ray

Optical Thin-Film Reflection Filters Based on the Theory of Photonic Crystals.

Effect of Energy Monochromaticity and Interfacial Roughness on Multilayer Reflectivity

A Method of Calculating Interfacial Roughness of Multilayers for Soft X-Ray

The computations of reflection coefficients of multilayer structure based on the reformulation of Thomson-Haskell method.

Numerical and Experimental Analysis of a Focused Reflected Wave in a Multi-Layered Material Based on a Ray Model.

An Approximate Method for Calculating Thickness of Metal Multilayer Interface

Effect Of Thickness Ratio Deviation On Soft-X-Ray Diffraction Of Multilayers

SMALL-ANGLE X-RAY DIFFRACTION STUDY OF AMORPHOUS MULTILAYER AND SINGLE LAYER THIN FILMS

General Theory Of Optical Reflection From A Thin Film On A Solid And Its Application To Heteroepitaxy

X-ray multilayer mid-frequency characterizations using speckle scanning techniques

SMALL ANGLE X-RAY DIFFRACTION OF THE SINGLE METAL FILM

Analysis Of The Thickness Measurement Of Multilayer Optical Thin Films With Grazing Incident X-Ray

Effective-substrate theory for optical reflection from a layered substrate.

Precise Calculation of the Periodic-thickness for Multilayer

Optimization Design of Pt/C Multilayer Supermirrorsfor Hard X-rays

Effect of the Energy Resolution on the Reflectivity of Multilayer

Study on Reflection Properties of Multilayer Thin Films on the Metallic Substrate

X-ray Diffraction of Multilayers with a Systematic Deviation of Period

In-plane Interfacial Phonon Transport Through Multi-Layer Thin Films by Theoretical Analyses and Monte Carlo Simulations