Abstract:Scanning electron microscopy (SEM) enables microstructure characterization at multi-scale, having potential to quantify strain distribution across multiple fields of view (FOVs) and exploring coordinated relationships among the deformations of multi-scale microstructures. Optimizing distribution of multi-scale speckles is crucial for achieving high precision and efficiency in digital image correlation (DIC) computations. In this work, a multi-scale strain measurement method is proposed for in-situ SEM mechanical experiments, which relies on an uncomplicated multi-scale speckle preparation method. Multi-scale speckle preparation can be achieved by the combination of spin-coating and magnetron sputtering. By using micro- and macro-speckle, multi-scale strain calculations can be achieved during the in-situ SEM mechanical loading. The InSn macro-speckle is composed of controllable-sized InSn nanoscale speckles, ensuring that the accuracy of DIC measurements in the microscopic regions are not compromised by the coverage of macro-speckles in the testing region. In regions covered exclusively by SiO2 nano-speckles, in-situ SEM mechanical loading allows for the acquisition of high-resolution DIC (HR-DIC) and electron backscatter diffraction (EBSD) data from the same region and under the same deformation state. Experiments are conducted to illustrate the functionality and utility of the multi-scale speckles. Such experimental analyses offer an opportunity to further explore multi-scale strain heterogeneity in some advanced structural materials and provide reliable experimental verification for material mechanics simulations.

X-ray multilayer mid-frequency characterizations using speckle scanning techniques

Scanning Interferometric Method for Measuring Group Delay of Dispersive Mirrors

Ultrasonic Array Imaging of Multilayer Structures Using Full Matrix Capture and Extended Phase Shift Migration

Quantifying Hidden Defect In Multi-Layered Structures By Using Eddy Current System Combined With A Scanner

Imaging and tracking through scattering medium with low bit depth speckle

X-ray scattering of periodic and graded multilayers: comparison of experiments to simulations from surface microroughness characterization

Simultaneous Measurement of Local Longitudinal and Transverse Wave Velocities, Attenuation, Density, and Thickness of Films by Using Point-Focus Ultrasonic Spectroscopy

Surface Patterning for Multi-Scale Strain Analysis of In-Situ Sem Mechanical Experiments

X-ray standing wave and reflectometric characterization of multilayer structures

Characterization of Dual-Periodic Structures with Optical Scattering

Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique

Numerical and Experimental Analysis of a Focused Reflected Wave in a Multi-Layered Material Based on a Ray Model.

X-ray scattering methods for films and multilayers and their applications

Theoretical and experimental investigations of speckle features based on free-space surface scattering

Etching of Multilayer Grating Using a Narrow Spectral Band X-ray

Optimization Design of Pt/C Multilayer Supermirrorsfor Hard X-rays

X-ray Wavefront Characterization with Grating Interferometry Using an X-Ray Microfocus Laboratory Source

Wavefront Sensing and Surface Shape Measurement Based on Microfocus X-Ray Grating Interferometer

X-ray wavefront sensing and optics metrology using a microfocus x-ray grating interferometer with electromagnetic phase stepping

Experimental study on X-ray Bragg-Fresnel optics

Analysis of microroughness evolution in X-ray astronomical multilayer mirrors by surface topography with the MPES program and by X-ray scattering