Quantifying Hidden Defect In Multi-Layered Structures By Using Eddy Current System Combined With A Scanner

Pingjie Huang,Zekui Zhou,Zhaotong Wu
DOI: https://doi.org/10.1088/1742-6596/13/1/088
2005-01-01
Abstract:The eddy current testing forward model of scanning inspection of multi-layered structures is introduced and simulation work is carried out to reveal the interaction between the scanning coil and defects with different geometric properties. A multi-frequency ECT experimental instrument combined with a scanner is established and scanning inspections are performed to detect the artificial etched flaws with different geometric parameters in the multi-layered structures. The predicted signals by the forward model are compared with the measured signals and the defects are characterized.
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