Quantifying Geometry Parameters of Defect in Multi-layered Structures from Eddy Current Nondestructive Evaluation Signals by Using Genetic Algorithm

Bo Ye,Guangxin Zhang,Pingjie Huang,Mengbao Fan,Song Zheng,Zekui Zhou
DOI: https://doi.org/10.1109/wcica.2006.1714094
2006-01-01
Abstract:In order to detect defects in multilayered conductive structures, a novel approach to accurately quantify the two-dimensional axial symmetry defect geometry parameters from eddy current nondestructive evaluation (ECNDE) signals is presented. The method uses a finite element forward model to simulate the underlying physical process and the genetic algorithm (GA) to solve the inverse problem. Experimental results confirm the validity of the approach
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