Study on Reflection Properties of Multilayer Thin Films on the Metallic Substrate

Zhao Lin,Feng Yijun
DOI: https://doi.org/10.19472/j.cnki.1008-8652.2008.04.002
2008-01-01
Abstract:A method for calculating reflection factor of multilayer thin film on metallic background is deduced by calculating characteristic matrix of multilayer thin film structure and using microwave network ideas.The correctness of this algorithm is verified by illustration,and this provides a basis in theory for approximate calculation of electromagnetic scatter of multilayer thin film structure on metallic background.
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