Confirmatory experiment for calculation of penetration depth of X-ray in polyethylene thin film

CHENG Feng-mei,LI Hai-dong,ZHANG Ji-dong
DOI: https://doi.org/10.3969/j.issn.1005-4642.2010.05.001
2010-01-01
Abstract:A silver film is deposited onto polyethylene thin film by silver mirror reaction.Grazing incidence X-ray diffraction with different incident angles is used to characterize such thin film.By comparing the experimental results and theoretical calculations,it is confirmed that the equation derived from smooth interface can be used to calculate the X-ray penetration depth.
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