Abstract:There is an ever increasing interest in the development of plasmonic 2D nanomaterials, with widespread applications in optoelectronics, high resolution microscopy, imaging and sensing, among others. With the current ability of ultrathin noble metal film deposition down to a few monolayers in thickness, there is a need for an analytical expression of the thickness dependent complex dielectric function for predicting optical properties for arbitrary thicknesses. The free and bound electron contributions to the dielectric function are dealt with independently, since their influences affect separate wavelengths ranges. The former is dealt within the Drude model framework for large wavelengths with appropriately addressed damping constant and plasma frequency parameters to account for thickness dependence. Applying our previously developed method, we determine these parameters for specific film thicknesses, based on refractive index experimental values for Ag and Au thin films. Fitting separately each one of these parameters allowed us to find an analytical expression for their dependence on arbitrary film thickness and consequently for the free electron contribution. Concerning bound electrons, it is seen that its contribution for small wavelengths is the same for all analyzed thicknesses and may be set equal to the bulk bound contribution. Taking all these facts into account, the complex dielectric function can be rewritten analytically, in terms of the bulk dielectric function plus corrective film thickness dependent terms. In particular, the fitting process for the damping constant allows us to determine that the electron scattering at the film boundary is mainly diffusive (inelastic) for both silver and gold thin films. It is also shown that, in accordance with theoretical studies, plasma frequency shows a red shift as the film thickness decreases.

Thickness and microstructure effects in the optical and electrical properties of silver thin films

Experimental Study on the Influence of the Metal Film Thickness on Surface Plasmon Resonance Biosensors

Study on the property of subwavelength imaging in a metal thin-film structure

Determination of Thickness-dependent Damping Constant and Plasma Frequency for Ultrathin Ag and Au Films: Nanoscale Dielectric Function

Effect of Ag Film Thickness on the Morphology and Light Scattering Properties of Ag Nanoparticles

The investigation of thickness-dependent mono-fractal, optical and optoelectronics properties of sputtered silver thin film for silicon solar cell

Evaluating size effects on the thermal conductivity and electron-phonon scattering rates of copper thin films for experimental validation of Matthiessen's rule

Optical characteristics of ultra-thin metallic films excited at visible range

Optical Characteristics of Silver Thin Films from Island to Percolation in the Ultra-Wide Infrared Spectral Range

Surface Vs. Bulk Electronic Structure of Silver Determined by Photoemission

Characterization of Dielectric Function for Metallic Thin Films Based on Ellipsometric Parameters and Reflectivity

Effects of Film Thickness on the Optical Properties of Aginsbte Phase-Change Films

Thickness-Dependent Free-Electron Relaxation Time of Au Thin Films in Near-Infrared Region

Optical and electrical properties of nanostructured metallic electrical contacts

Effect Of Molecular Film Thickness On Thermal Conduction Across Solid-Film Interfaces

A Model Of Size Effect On Thermal Conductivity For Thin Metallic Films

Thickness Dependence of Surface Plasmon Damping and Dispersion in Ultrathin Ag Films

Study on Ultrathin Silver Film Transparent Electrodes Based on Aluminum Seed Layers with Different Structures

Effect Of Silver Evolution On Conductivity And Transmittance Of Zno/Ag Thin Films

Effects of Film Thickness Less Than Electrical Mean Free Path on Reflectivity

Study of the Grain Size Effects on Electrical Resistivity Model for Ultrathin (10-50 Nm) Cu Films