Thickness Dependence of Surface Plasmon Damping and Dispersion in Ultrathin Ag Films

YH Yu,Y Jiang,Z Tang,QL Guo,JF Jia,QK Xue,KH Wu,EG Wang
DOI: https://doi.org/10.1103/physrevb.72.205405
IF: 3.7
2005-01-01
Physical Review B
Abstract:The thickness dependence of the surface plasmon damping and dispersion of atomically flat and ultrathin silver films deposited on the Si(111)-(7x7) surface was investigated by a combined high-resolution electron-energy-loss spectroscopy (HREELS) and scanning tunneling microscopy (STM) system. We found stronger plasmon energy dispersion with the momentum parallel to the surface (q(parallel to)) in thicker films, and a significant dependence of the damping edge on the film thickness. Both of them can be associated with the presence of quantum well states (QWS) in the direction perpendicular to the film surface, which influences the interband transitions between the lower and upper 5sp bands of silver.
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