Visible Photoluminescence Induced in Samples by Si Implantation

AD Lan,BX Liu,XD Bai
DOI: https://doi.org/10.1088/0953-8984/9/23/022
1997-01-01
Abstract:Implantation-induced visible light emission was studied using 120 and 160 keV Si-ion implantation into Si single crystals covered with thin layers of various thicknesses. A visible band centred at around 2.0 eV was observed from the samples implanted to a dose range of . After post-annealing at in flowing gas, another visible band located at 1.7 eV was detected for all of the samples. The photoluminescence intensity was found to correlate with the oxygen concentration in the implantation region, which was estimated using the program TRIM-92 (from `transport of ions in matter'). A mechanism that may be responsible for the observed light emission was discussed in terms of the so-called three-region model.
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