Luminescence from Si/SiO 2 with Si Implantation

Lan Ai-dong,Liu Bai-xin,Bai Xin-de
DOI: https://doi.org/10.1088/0256-307x/14/7/020
1997-01-01
Chinese Physics Letters
Abstract:Silicon single crystals with a SiO2 overlayer of various thicknesses (1000-6000Å) were implanted by 120 and 160 keV Si-ions to doses in a range of (0.5-1.0) × 1017 cm-2 to study the visible light emission in their as-implanted and post-annealed states. An emission band peaked around 2.0 eV was visible in the photoluminescence (PL) spectra of all the as-implanted samples. After post-annealing at 1100°C in a flowing N2 gas, it was found that a visible band peaked in the range of 1.7 eV is detectable from all the samples and that the PL intensity exhibits a correlation with the oxygen concentration in the implanted region. Possible mechanisms responsible for the observed light emission were also discussed.
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