Luminescence from Si/SiO 2 with Si implantation

Lan Ai-dong,Liu Bai-xin,Bai Xin-de
DOI: https://doi.org/10.1088/0256-307X/14/7/020
1997-01-01
Chinese Physics Letters
Abstract:Silicon single crystals with a SiO 2 overlayer of various thicknesses (1000-6000?) were implanted by 120 and 160 keV Si-ions to doses in a range of (0.5-1.0)��10 17cm -2 to study the visible light emission in their as-implanted and post-annealed states. An emission band peaked around 2.0 eV was visible in the photoluminescence (PL) spectra of all the as-implanted samples. After post-annealing at 1100�� C in a flowing N 2 gas, it was found that a visible band peaked in the range of 1.7 eV is detectable from all the samples and that the PL intensity exihibits a correlation with the oxygen concentration in the implanted region. Possible mechanisms responsible for the observed light emission were also discussed. ? 1997 by Allerton Press, Inc.
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