Quantitative Calculation of the Residual Stress in Crystal Based on Synchrotron Radiation White Beam Topography

Sheng SONG,Ying-xin CUI,Kun YANG,Xian-gang XU,Xiao-bo HU,Wan-xia HUANG,Qing-xi YUAN
2013-01-01
Abstract:A method for quantitave calculation of the residual stress in crystal materials based on synchrotron radiation white-beam topography was proposed. There is a quantitave relationship between residual stress and lattice distortion, while the distortion of diffraction spot represents the lattice distortion. So the residual stress could be calculated on the basis of experiment results. As an application example, the residual stress in a SiC monocrystal sample were quantitavely calculated. The experiment and calculation process were demonstrated in detail. It was proved that the major residual stress was normal stress in this sample.
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