High-performance fully transparent Ga-doped ZnO TFTs fabricated by RF Magnetron Sputtering

Zhang Suoming,Tian Yu,Han Dedong,Shan Dongfang,Huang Fuqing,Wang Shuyang,Zhang Xing,Zhang Shengdong,Wang Yi
DOI: https://doi.org/10.1109/VLSI-TSA.2013.6545630
2013-01-01
Abstract:We report on the fabrication of fully transparent Ga-doped ZnO TFTs on glass. The device shows excellent performance which on-off ratio, Vt, SS, field effect mobility is 4×109, 3.2v, 235mV/decade, 370cm2/v&middots, respectively. The performance is significantly improved by annealing treatment, with much steeper SS of 107mV/decade and much lower V t of 0.7v. © 2013 IEEE.
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