Calculation of the valence band structure in strained In 0.7Ga0.3As devices with different surface orientation

Pengying Chang,Lang Zeng,Xiaoyan Liu,Kangliang Wei,Jieyu Qin,Kai Zhao,Gang Du,Xing Zhang
DOI: https://doi.org/10.1109/SISPAD.2013.6650656
2013-01-01
Abstract:Using the eight-band k·p Hamiltonian approach, the valence band structure of strained In0.7Ga0.3As is calculated for (001), (110) and (111) orientation. The impact of biaxial strain and uniaxial strain on energy band splitting and warping is investigated. The dependency of the valence band structure on the surface electric field and body thickness is also studied in this work. © 2013 IEEE.
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