All-Epitaxial Trilayered Ferroelectric (Bi,La)<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub>/Pb(Zr<sub>0.4</sub>Ti<sub>0.6</sub>)O<sub>3</sub>/(Bi,La)<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub> Thin Films on SrTiO<sub>3</sub> Substrates by Pulsed Laser Deposition

Dinghua Bao,Xinhua Zhu,Marin Alexe,Dietrich Hesse
DOI: https://doi.org/10.1143/JJAP.44.6910
2005-01-01
Abstract:Trilayered ferroclectric (Bi,La)(4)Ti3O12 (BLT)/Pb(Zr,Ti)O-3 (PZT)/(Bi,La)(4)Ti3O12 thin films were grown epitaxially on SrTiO3 (STO) substrates by pulsed laser deposition. The epitaxial relationships between BLT, PZT and STO were identified to be BLT(001) parallel to PZT(001) parallel to STO(001) and BLT[110] parallel to PZT[100] parallel to STO[100] for the trilayered thin films on (001)-oriented STO substrates, whereas for the trilayered thin films on (01 I)-oriented STO substrates, the epitaxial relationships were BLT(118) parallel to PZT(011) parallel to STO(011) and BLT[(1) over bar(1) over bar0] parallel to PZT[100] parallel to STO[100]. The morphology of the BLT/PZT interfaces and of the surface of the trilayered thin films depended largely on the orientation of the film layers. A rather large remanent polarization as well as a high fatigue resistance of up to 10(10) switching pulse cycles was obtained for the trilayered thin films deposited on SrRuO3-coated STO substrates.
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