Epitaxial growth of multilayered (Bi,La)<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub>/Pb(Zr,Ti)O<sub>3</sub> ferroelectric thin films with different orientations

Dinghua Bao,Xinhua Zhu,Marin Alexe,Dietrich Hesse
DOI: https://doi.org/10.1007/s10832-007-9079-5
2008-01-01
Journal of Electroceramics
Abstract:Epitaxial (Bi,La)(4)Ti3O12 (BLT) thin films, epitaxial Pb(Zr,Ti)O-3 (PZT) thin films, and epitaxial multilayered BLT/PZT ferroelectric thin films with different orientations were prepared on SrTiO3 (STO) single crystal substrates by pulsed laser deposition. From X-ray pole-figures and electron diffraction patterns, the epitaxial orientation relationships between BLT layers, PZT layers, and STO substrates were identified to be (1) BLT(001)// PZT(001)//STO(001), and BLT[110]//PZT[100]//STO[100] for the multilayered thin films on (001)-oriented STO substrates, and (2) BLT(118)//PZT(011)//STO(011), and BLT[(1) over bar(1) over bar0]//PZT[100]//SrTiO3[100] for the multilayered films on (011)-oriented STO substrates. Tri-layered films of the same compositions showed well-defined hysteresis loops as well as a high fatigue resistance up to 1 x 10(10) switching cycles.
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