Abstract:The morphology and microstructure of all-epitaxial (Bi,La)4Ti3O12/Pb(Zr0.4Ti0.6)O3/(Bi,La)4Ti3O12 (BLT/PZT/BLT) tri-layered ferroelectric films, grown on (011)-oriented SrTiO3 (STO) substrates by pulsed laser deposition, are investigated by transmission electron microscopy (TEM). X-ray diffraction and electron diffraction patterns demonstrate that the epitaxial relationship between BLT, PZT and STO can be described as \({\rm (118)_{BLT}//(011)_{PZT}//(011)_{STO}}\); \({\rm [\overline{1}\,\overline{1}\,0]_{BLT}//[1\,0\,0]_{PZT}//[1\,0\,0]_{STO}}\). Cross-sectional TEM images show that the growth rate of BLT is nearly two times that for PZT at the same growth conditions, and 90° ferroelectric domain boundaries lying on {110} planes are observed in the PZT layer. The 90° ferroelectric domains in the PZT layer extend up to 600 nm in length. Long domains penetrate into the neighboring columnar grain through the columnar grain boundary, whereas others are nucleating at the columnar grain boundaries. The roughness of the PZT/BLT interfaces appears to depend on the viewing direction, i.e., it is different for different azimuthal directions. Planar TEM investigations show that the grains in the top BLT layer have a rod-like morphology, preferentially growing along the [110]BLT direction. The grain width is rather constant at about 90 nm, whereas the length of the grains varies from 150 to 625 nm. These morphological details point to the important role the crystal anisotropy of BLT plays for the growth and structure of the tri-layered films.

Growth, Structure, And Properties Of All-Epitaxial Ferroelectric (Bi,La)(4)Ti3o12/Pb(Zr0.4ti0.6)O-3/(Bi,La)(4)Ti3o12 Trilayered Thin Films On Srruo3-Covered Srtio3(011) Substrates

All-Epitaxial Trilayered Ferroelectric (Bi,La)<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub>/Pb(Zr<sub>0.4</sub>Ti<sub>0.6</sub>)O<sub>3</sub>/(Bi,La)<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub> Thin Films on SrTiO<sub>3</sub> Substrates by Pulsed Laser Deposition

Microstructure and Ferroelectric Properties of Low-Fatigue Epitaxial, All (001)-Oriented (bi,la)4ti3o12∕pb(zr0.4ti0.6)o3∕(bi,la)4ti3o12 Trilayered Thin Films on (001) SrTiO3 Substrates

All-Epitaxial Trilayered Ferroelectric (Bi,La)(4)Ti3o12/Pb(Zr0.4ti0.6)O-3/(Bi,La)(4)Ti3o12 Thin Films On Srtio3 Substrates By Pulsed Laser Deposition

All-Epitaxial Multilayered Ferroelectric (Bi,La)(4)Ti3o12/Pb(Zr0.4ti0.6 )O-3 Thin Films On Srtio3 Substrates By Pulsed Laser Deposition

Epitaxial growth of multilayered (Bi,La)<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub>/Pb(Zr,Ti)O<sub>3</sub> ferroelectric thin films with different orientations

Morphology and Microstructure of All-Epitaxial Ferroelectric Tri-Layered (bi,la)4ti3o12/pb(zr0.4ti0.6)o3/ (bi,la)4ti3o12 Thin Films on SrTiO3(011)

Epitaxial growth of multilayered (Bi,La) 4 Ti 3 O 12 /Pb(Zr,Ti)O 3 ferroelectric thin films with different orientations

Morphology and microstructure of all-epitaxial ferroelectric tri-layered (Bi,La) <sub>4</sub>Ti <sub>3</sub>O <sub>12</sub>/Pb(Zr <sub>0.4</sub>Ti <sub>0.6</sub>)O <sub>3</sub>/ (Bi,La) <sub>4</sub>Ti <sub>3</sub>O <sub>12</sub> thin films on SrTiO <sub>3</sub>(011)

Epitaxial growth of multilayered (Bi,La)TiO/Pb(Zr,Ti)O ferroelectric thin films with different orientations

Fatigue Behaviors Of Bi3.25la0.75ti3o12/Pb(Zr0.52ti0.48)O-3/Bi3.25la0.75ti3o12 Trilayered Thin Films

Ferroelectric Properties of Bi3.25La0.75Ti3O12 Thin Films Prepared by Chemical Solution Deposition

Ferroelectric Properties of Bilayer Structured Pb(Zr0.52Ti0.48)O3/SrBi2Ta2O9 (PZT/SBT) Thin Films on Pt/TiO2/SiO2/Si Substrates

Enhanced Ferroelectric Properties Of Pb(Ta0.05zr0.48ti0.47)O-3 Thin Films On Pt/Tio2/Sio2/Si Substrates Using La0.67sr0.33mno3 Buffer Layers

Structural and Electrical Properties of Bi3.25la0.75ti3o12 and Bi3.25pr0.75ti3o12 Thin Films for Memory Applications

Ferroelectric Properties Of La And Zr Substituted Bi4ti3o12 Thin Films

SrBi4Ti4O15 thin films of Ti containing bismuth-layered-ferroelectrics prepared by pulsed laser deposition

Characterization And Properties Of Lanthanum-Substituted Bismuth Titanate Ferroelectric Thin Films For Feram Application

Epitaxial Pb(Zr0.53ti0.47)O-3/Lanio3 Heterostructures on Single Crystal Substrates

Preparation and ferroelectric properties of (124)-oriented SrBi4Ti4O15 ferroelectric thin film on (110)-oriented LaNiO3 electrode

Effects of Zr substitution on structures and ferroelectric properties of Bi<sub>3.25</sub>La<sub>0.75</sub>Ti<sub>3</sub>O<sub>12</sub> thin films