Microstructure and Ferroelectric Properties of Low-Fatigue Epitaxial, All (001)-Oriented (bi,la)4ti3o12∕pb(zr0.4ti0.6)o3∕(bi,la)4ti3o12 Trilayered Thin Films on (001) SrTiO3 Substrates
DH Bao,XH Zhu,M Alexe,D Hesse
DOI: https://doi.org/10.1063/1.1946913
IF: 2.877
2005-01-01
Journal of Applied Physics
Abstract:( Bi , La ) 4 Ti 3 O 12 ( BLT ) ∕ Pb ( Zr , Ti ) O 3 ( PZT ) ∕ ( Bi , La ) 4 Ti 3 O 12 trilayered ferroelectric thin films were epitaxially grown by pulsed laser deposition onto (001) SrTiO3 (STO) substrates with and without SrRuO3 (SRO) bottom electrodes. From x-ray pole figures and electron-diffraction patterns, the epitaxial relationships between BLT, PZT, SRO, and STO were identified to be BLT(001)‖PZT(001)‖SRO(001)‖SrTiO3(001); BLT[110]‖PZT[100]‖SRO[100]‖SrTiO3[100]. Cross-sectional transmission electron microscopy investigations revealed that 90° ferroelectric domain boundaries lying on {110} planes are present in the PZT layer, with an average domain width of 20nm and an average spacing of 120nm. These long 90° ferroelectric domains, as a rule having nucleated at the bottom of the PZT layer, extend to the top of the latter. The thin films have sharp BLT/PZT interfaces and a very flat surface. The remanent polarization and coercive field were determined as 13.9μC∕cm2 and 72.9kV∕cm, respectively, indicating that the epitaxial, all (001)-oriented trilayered thin films have rather good ferroelectric properties, although single epitaxial (001)-oriented BLT films are usually not favored for application due to their very poor ferroelectric properties. The thin films showed a high fatigue resistance at least up to 1010 switching pulse cycles, confirming that such a trilayered structure effectively shows the fatigue-free behavior of BLT.