Abstract:Silver (Ag) thin films have garnered significant attention due to their unique optical properties. This paper systematically investigates the optical characteristics of Ag films prepared using the electron beam evaporation method. The investigation was conducted using spectroscopic ellipsometry and covers a broad wavelength range of 1679 nm to 36 μm (0.738–0.034 eV), spanning from near-infrared to far-infrared regions. Optical and dispersion models were developed to analyze the impacts of Ag nanostructures on the complex refractive indices, dielectric functions, and reflectance. The results indicate that Ag particles and coalescence films exhibit non-metallic and low absorption properties, while Ag percolation and continuous films present a typical Drude model. The reflectance of Ag films increases as the film coverage ratio increases, and it can reach close to 100% in continuous film. Additionally, a non-destructive, non-contact, and vacuum-free means of confirming the percolation threshold of Ag films was proposed based on the slope of the imaginary part curve. This work is useful to guide simulations and provide a basis for the applications of Ag films in different fields.

Infrared Light Absorption of Silver Film Coated on the Surface of Femtosecond Laser Microstructured Silicon in Sf6

Enhanced Light Absorption of Ag Films Deposited Onto Femtosecond Laser Microstructured Silicon

Infrared Light Absorption and Emissivity of Silicon Microstructured by Femtosecond Laser in SF6

Broad band enhanced infrared light absorption of a femtosecond laser microstructured silicon

Surface Morphology and Infrared Absorption of Silicon Irradiated by Picosecond Laser Pulses in Sf6

Great enhancement of infrared light absorption of silicon surface-structured by femtosecond laser pulses in N2 ambient

Strong Mid-Infrared Absorption and High Crystallinity of Microstructured Silicon Formed by Femtosecond Laser Irradiation in NF3 Atmosphere

Greatly enhanced infrared normal spectral emissivity of microstructured silicon using a femtosecond laser

Enhanced Optical Absorption of Amorphous Silicon Films by Ag Nanostructures

Strong infrared absorber: Surfacemicrostructured Au film replicated from black silicon

Optical Characteristics of Silver Thin Films from Island to Percolation in the Ultra-Wide Infrared Spectral Range

Mid-infrared Absorption of Femtosecond Laser Microstructured Silicon Formed in Different Gas Ambient

Ultrahigh Infrared Normal Spectral Emissivity of Microstructured Silicon Coating Au Film.

Crystallinity and Sub-Band Gap Absorption of Femtosecond-Laser Hyperdoped Silicon Formed in Different N-Containing Gas Mixtures

Silicon micro-structuring using ultra-short laser pulses

Photoluminescence enhancement of Silicon-rich silicon nitride film induced by silver localized surface plasmon

Comparison of structure and properties of femtosecond and nanosecond laser-structured silicon

Light Absorption Enhancement of Amorphous Silicon Film Coupled with Metal Nanoshells

Enhanced Broadband Light Absorption in Silicon Film by Large-Size Lumpy Silver Particles

Separation of Mid-IR Light Trapping and Sulfur-Donor Absorption in Nanosecond-Laser Sulfur-Hyperdoped Silicon: a Way to Spatially- and Spectrally-Engineered Interband IR-Absorption

Infrared Laser Induced SF6 Interaction with Silicon and Tungstun Surfaces