Abstract:Here we report, the room temperature deposition of silver (Ag) thin films on silicon, glass and silicon solar cell substrates by magnetron sputtering. The effect of thickness on the deposited thin films and their morphological, fractal, optical and solar cell parameters have been extensively investigated. AFM results show that the Ag thin films are composed of different-size of nano-grains and the grain size increases with increasing thickness. Mono-fractal parameters, namely fractal dimension (Df) and Hurst exponent (H), were determined from the power spectral density function. X-ray photoelectron spectroscopy studies indicate that the deposited samples exhibit the presence of oxidation state of Ag (0) in thin films, confirming the stable structure. The optical analysis shows that the transmittance of the deposited thin films decreases with increasing thickness, on the other hand, the silver thin film with thickness of 20 nm shows surface Plasmon resonance (SPR) at 436 nm. Current-voltage (I–V) curves were measured in dark and under illumination mode at standard testing conditions, i.e., 300K, 1000 W/m 2 and 1.5 AM global using a solar simulator. These measurement studies indicate that thicknesses are effectively impacts on photovoltaic performance. The calculated values of change in solar efficiency ( Δη ) are 0.26, −0.20, −0.76 and −6.88 % for thin films with nominal thickness 0.5, 1, 2 and 20 nm respectively.

Study on Multifractal Spectrum of Semicontinuous Ag Films

Fractal Description of Surface Topography of Ultrathin Au Films

Multifractal Study of Atomic Force Microscopic Images of Al-doped ZnO Thin Films

Study of grey level threshold selection of TEM images of Au-MgF2 cluster film

Multifractal analysis of the spatial distribution of the film surfaces with different roughening mechanisms

Multi-fractal Spectra of TEM Images of MoO3 Nanofibres

AFM Study and Multifractal Analysis of Rough Film Surfaces

Microstructure and electrical properties of ultrathin gold films prepared by DC sputtering

CHARACTERISTICS OF Ag THIN FILMS DEPOSITED ON THE FRACTAL SUBSTRATES OF Α-Al２ｏ3 CERAMICS

Crystallinity and Iv Characteristics of Ag Thin-Films Deposited on Fractal Substrates

Multifractal Analysis of TiO_2 Thin Film Surface Topographies

Film thickness effect on fractality of tin-doped In2O3 thin films

Study on elastic modulus of ultra-thin copper films by in-situ SEM-SPM nanoindentation

Conductivity Measurements of A Metallic Diffuse-Fringe Film Percolation System

Thin silver films deposited in random fractal surfaces and their nonlinear dc I–V behavior

Ion Beam Method to Study Fractal Aggregation of Magnetic Particles on Thin Solid Films:

The investigation of thickness-dependent mono-fractal, optical and optoelectronics properties of sputtered silver thin film for silicon solar cell

Interface-Induced Complex Electronic Interference Structures in Ag Films on Ge(111)

In-situ observation of crack propagation through the nucleation of nanoscale voids in ultra-thin, freestanding Ag films

Electron Emission from Amorphous Carbon Film on Discontinuous Ag Islands

Study of the Electromigration Behaviour of Au–Ag Thin Films Deposited on SiO 2 Substrate Using AES, XPS and AFM Techniques