Conductivity Measurements of A Metallic Diffuse-Fringe Film Percolation System

GX Ye,QR Zhang,CM Feng,XM Tao,ZK Jiao,HL Ge
DOI: https://doi.org/10.1002/pssa.2211570107
1996-01-01
Abstract:We have fabricated a metallic diffuse-fringe film system by dc-magnetron sputtering method. The diffuse fringe structure of the film system is obviously observed when during the film deposition process the distance between the shutter slit and the substrate is large enough. An anomalous, nonlinear I-V behavior is found in the system and can be well explained by the Joule heating and hopping effects. The strong dependence between the conductivity behavior and the fringe indicates that the fringe effect is very severe in this inhomogeneous percolation system.
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