Conductivity and dielectric constant in a wedge-shaped Pt-film percolation system

gaoxiang ye,yuqing xu,hongliang ge,zhengkuan jiao,qirui zhang
DOI: https://doi.org/10.1016/0375-9601(94)00995-2
IF: 2.707
1995-01-01
Physics Letters A
Abstract:A wedge-shaped Pt-film percolation system was prepared by the magnetron sputtering method. A new nonlinear I-V behavior was found and can be well explained by the location-dependent hopping effect. Power-law behavior, sigma (omega) alpha omega(x) and epsilon (omega) alpha omega(-y), is observed near the percolation threshold. The exponents x and y are found to be 0.87 +/- 0.04 and 0.08 +/- 0.03, respectively, in agreement with the general scaling relation x + y = 1.
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