Multifractal analysis of the spatial distribution of the film surfaces with different roughening mechanisms

J. Hou,Wang Yan,Xia Rui,Zhu Xiaoguang,Wang Haiqian,Z. Wu
DOI: https://doi.org/10.1103/PhysRevE.58.2213
IF: 2.707
1998-01-01
Physical Review E
Abstract:Thin films of C-60/Ag were prepared by codeposition of C-60 and Ag onto (001) NaCl substrates. The surface roughness depends strongly on the substrate temperature, and a transition from kinetically roughening to thermally roughening was observed by using atomic force microscopy. Multifractal spectra of the film surfaces have been studied in the length scale of 30 nm to 5 mu m. Compared with the conventional root-mean-square method, the multifractal spectrum provides more information about the spatial distribution of the surface roughness.
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