AFM Study and Multifractal Analysis of Rough Film Surfaces

孙霞,王晓平,丁泽军,吴自勤
DOI: https://doi.org/10.3969/j.issn.1000-6281.2002.03.016
2002-01-01
Abstract:Regularly rough surfaces, similar to the atomic force microscope (AFM)images, with different characteristics have been simulated by generation units.The parameters of multifractal spectrum obtained from the regularly rough surfaces have been discussed in detail. Merits of the multifractal analysis are demonstrated by comparing these parameters with root mean square roughness (rms) and simple fractal dimensionD0. The surface topographies of ZnO films and polymer PtBuA thin films measured by AFM are analyzed by multifractal.
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