Analysis and measurement of AFM/FFM image

Wang,Xinchun Lu,Linmao Qian,Bing Shi,Shizhu Wen
1998-01-01
Abstract:According to the characteristics of AFM/FFM (atomic force microscope/friction force microscope) image, a FORTRAN program for the analysis and measurement of the image is compiled by the methods of surface roughness and fractal geometry. The transversal parameters, longitudinal parameters, height distribution, surface bearing curves, auto-covariance function, power spectrum density and fractal dimension are included. The micro-scale friction force is related to the surface profile and its slope.
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