Influence of AFM Scanning Parameters on Surface Roughness Measurement

WANG Zi-yi,ZHANG Rong-jun,ZHENG Yu-xiang,ZHANG Zhen-sheng,LI Hai-tao
DOI: https://doi.org/10.3969/j.issn.1006-7167.2013.02.002
2013-01-01
Abstract:Atomic Force Microscope(AFM) is a very important tool in nanotechnology research.As a near field image system,the scanning parameters have a huge effect on the quantity of sample image.Improper scanning parameters may even hurt the sample.In this paper,the control variable method was introduced in changing the scanning parameters,and the RMS(root mean square) roughness was used as criteria.The effect of different parameters on the sample image was studied and summarized.The results show that the amplitude setpoint,scan rate,integral gain have great impact on the measurement of the sample surface roughness.The image quality could be improved by changing the scanning parameters properly.
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