Study on the p-type conductivities and Raman scattering properties of N~+ ion-implanted O-rich ZnO thin films

Yang Tian-Yong,Kong Chun-Yang,Ruan Hai-Bo,Qin Guo-Ping,Li Wan-Jun,Liang Wei-Wei,Meng Xiang-Dan,Zhao Yong-Hong,Fang Liang,Cui Yu-Ting
DOI: https://doi.org/10.7498/aps.62.037703
IF: 0.906
2013-01-01
Acta Physica Sinica
Abstract:The p-type N doped ZnO thin films are fabricated using radio-frequency magnetron sputtering technique in O-rich growth con- dition together with the direct N + ion-implantation and annealing. The conductivities and Raman scattering properties of the samples are studied by Hall measurements and Raman spectra respectively. Hall measurements indicate that the optimal p-type ZnO film can be obtained when the sample is annealed at 600 C for 120 min in N 2 ambience, and its hole concentration is about 2.527 × 10 17 cm (-3) . N + -implantation induces three additional vibrational modes in ZnO, which are located at 274.2, 506.7 and 640.4 cm (-1) respectively. In the process of the annealing, by comparing the electrical properties and Raman speetra of the samples, we find that the competition between intrinsic donor defects and the activation of N acceptors plays a crucial role in the p-type formation of ZnO:N films during annealing.
What problem does this paper attempt to address?